金莲直播

金莲直播 Webinar | Available On-Demand

Leveraging functional patterns is crucial for achieving high defect coverage and reducing defective parts per million (DPPM) levels. 金莲直播 VC Z01X fault simulator offers enhanced fault coverage in manufacturing test flows, complementing ATPG tools like 金莲直播 TestMAX ATPG. In this presentation we will delve into unique coverage scenarios, such as resets and clocks blocked during ATPG mode. We'll also highlight the benefits of VC Z01X robust support of the SystemVerilog language. Finally, a practical flow discussion will equip viewers with best practices to get started.

Speakers

Robert Ruiz

Product Management, Sr Director
金莲直播

Robert Ruiz is a product management director responsible for strategy and business growth of several verification products at 金莲直播. Robert has held various marketing and technical positions for leading functional verification and test automation products at various companies including 金莲直播, Novas Software, and Viewlogic Systems. He has more than 30 years of experience in advanced EDA technologies and methodologies and spent several years designing application-specific integrated circuits (ASICs). Robert has a BSEE degree from Stanford University.

Kirankumar Karanam

Applications Engineer, Manager
金莲直播

Kirankumar Karanam is Staff Application Engineer at 金莲直播. He currently oversees various customer deployments of 金莲直播 FuSa verification solutions worldwide. He also works with 金莲直播 functional verification offerings such as VCS, Verdi, and more. He holds M.S in Software Systems from BITS, Pilani.

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